Scattering parameter measurements of infinite tunable reflectarrays

This paper presents a simple and effective technique for the scattering parameter measurements of infinite tunable reflectarrays in X-band frequency range. Tunable reflectarrays have been designed by using different types of slot configurations embedded in the patch elements. The scattering parameter measurements have been carried out using waveguide simulator technique and the measured results are found out to be in close agreement with the analysis carried out using Finite Element Method (FEM) and Finite Integral Method (FIM) techniques. A maximum change of 17% (10GHz to 8.3GHz) in the resonant frequency has been demonstrated by using rectangular and circular slots. Furthermore the achievable dynamic phase range of 314° demonstrates a feasibility of employing the proposed slot configurations for the design of active tunable reflectarray antennas.