• DocumentCode
    1869084
  • Title

    Gain calibration and feedforward automatic gain control for CMOS radio-frequency ICs

  • Author

    Hioe, W. ; Maio, K. ; Ooshima, T. ; Shibahara, Y. ; Doi, T.

  • Author_Institution
    Central Res. Lab., Hitachi Ltd., Tokyo, Japan
  • fYear
    2003
  • fDate
    12-14 June 2003
  • Firstpage
    127
  • Lastpage
    130
  • Abstract
    Two circuits for improving the performance of a Bluetooth CMOS RFIC are described. A RF amplifier gain calibration circuit uses a dummy amplifier to calibrate voltage gain and output voltage swing. The dummy amplifier´s and a target RF amplifier share the bias circuit, thereby allowing accurate RF gain control against temperature, bias and process variations. A 0.18 /spl mu/m CMOS calibration circuit achieved gain control within +/-0.5 dB. The second circuit, an interleafed multi-stage filter and IF amplifier for use in a low-IF receiver, has an AGC circuit with a novel feedforward control that allows rapid convergence of the amplifier gain. When applied to a Bluetooth signal, convergence was achieved within 5 /spl mu/s even in the worst case blocking signal condition.
  • Keywords
    Bluetooth; CMOS integrated circuits; automatic gain control; calibration; channel bank filters; feedforward; intermediate-frequency amplifiers; radiofrequency amplifiers; radiofrequency integrated circuits; 0.18 micron; 5 mus; AGC circuit; Bluetooth CMOS RFIC; CMOS calibration circuit; CMOS radio-frequency IC; IF amplifier; RF amplifier gain calibration circuit; dummy amplifier; feedforward automatic gain control; gain convergence; interleafed multistage filter; output voltage swing; worst case blocking signal; CMOS technology; Calibration; Filters; Gain control; Intrusion detection; Noise measurement; Radio frequency; Radiofrequency amplifiers; Radiofrequency integrated circuits; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Circuits, 2003. Digest of Technical Papers. 2003 Symposium on
  • Conference_Location
    Kyoto, Japan
  • Print_ISBN
    4-89114-034-8
  • Type

    conf

  • DOI
    10.1109/VLSIC.2003.1221180
  • Filename
    1221180