Title :
Temperature-dependent bias drift in proton-exchanged lithium niobate Mach-Zehnder modulators
Author :
Mueller, C.T. ; Coffer, J.G.
Author_Institution :
Aerosp. Corp., Los Angeles, CA, USA
Abstract :
Summary form only given. In this paper, we present data showing a temperature-driven hysteresis effect in the modulator bias and describe a model for its transient behavior based on the pyroelectric effect and an anomalous change in the temperature-dependent electrical conductivity. Our experiments suggest that these devices will require active bias control or some degree of temperature stabilization to maintain constant modulation depth and linearity in analog applications especially when operating with low bias to increase the linear dynamic range.
Keywords :
Mach-Zehnder interferometers; electrical conductivity; electro-optical modulation; hysteresis; ion exchange; lithium compounds; optical communication equipment; pyroelectricity; transient analysis; LiNbO/sub 3/; active bias control; analog applications; constant modulation depth; high bandwidth optical communications; linear dynamic range; linearity; low bias operation; modulator bias; proton-exchanged LiNbO/sub 3/ Mach-Zehnder modulators; pyroelectric effect; temperature stabilization; temperature-dependent bias drift; temperature-dependent electrical conductivity; temperature-driven hysteresis effect; transient behavior; Delay effects; Dielectric films; Dielectric measurements; Frequency; Lithium niobate; Optical films; Optical pulses; Pulse measurements; Semiconductor films; Silicon;
Conference_Titel :
Lasers and Electro-Optics, 1999. CLEO '99. Summaries of Papers Presented at the Conference on
Conference_Location :
Baltimore, MD, USA
Print_ISBN :
1-55752-595-1
DOI :
10.1109/CLEO.1999.834206
