Title :
Failure detection of the capacitor bank of the three phase diode rectifier
Author :
Kamel, T. ; Biletskiy, Yevgen ; Diduh, C.P. ; Liuchen Chang
Author_Institution :
Univ. of New Brunswick, Fredericton, NB, Canada
fDate :
April 29 2012-May 2 2012
Abstract :
This paper provides new methods to detect and investigate the failure in the DC filter of the power rectifier. The proposed diagnoses techniques are interested in two types of capacitor faults; capacitor aging and capacitor open circuit O.C. faults. The required inputs for the methods are the ripple of the DC voltage of the capacitors as well as the loading and the supply conditions.
Keywords :
ageing; failure analysis; fault diagnosis; power capacitors; power semiconductor diodes; rectifying circuits; DC filter; capacitor DC voltage; capacitor aging; capacitor bank; capacitor faults; capacitor open circuit OC faults; failure detection; phase diode rectifier; power rectifier; Aging; Capacitance; Capacitors; Circuit faults; Rectifiers; Testing; Voltage measurement; 3 Phases Rectifier; Capacitor Aging; Discrete Fourier Transform DFT; Open Circuit Fault;
Conference_Titel :
Electrical & Computer Engineering (CCECE), 2012 25th IEEE Canadian Conference on
Conference_Location :
Montreal, QC
Print_ISBN :
978-1-4673-1431-2
Electronic_ISBN :
0840-7789
DOI :
10.1109/CCECE.2012.6334967
