DocumentCode
1869295
Title
Spontaneous current disruptions in a plasma-driven double probe
Author
Svensson, A. ; Brenning, Nils
Author_Institution
Dept. of Plasma Phys., R. Inst. of Technol., Stockholm, Sweden
fYear
1997
fDate
19-22 May 1997
Firstpage
203
Lastpage
204
Abstract
Summary form only given. Measurements are made to investigate the nature of fast current disruptions appearing in one of the experimental devices in the Alfven Laboratory. The disruptions appear when we, in a transversely magnetized plasma flow, let the induced electric field (E=-v/spl times/B) drive a current between two externally short-circuited, floating, probes. In this configuration, the effective probe bias is E/spl middot/d, where .d is the distance across the magnetic field between the probes. One of the two probes collects ions (the ICP), and the other collects electrons (the CP). Simultaneous current and plasma density measurements show that the current during a disruption typically drops from a value 1-2 times larger than, and down to, the local ion saturation current at the ICP. We believe that cathode spots are repeatedly ignited at the surface of the ICP, and that the observed disruptions reflect that these cathode spots are extinguished 10-100 ns after ignition, during a phase when the current is still rising. The roles of the external circuit, the shapes of the probes, the probe bias, and the plasma stream parameters are investigated in detail.
Keywords
plasma magnetohydrodynamics; plasma probes; plasma transport processes; Alfven Laboratory; externally short-circuited floating probes; induced electric field; magnetic field; plasma stream parameters; plasma-driven double probe; probe bias; probe shape; spontaneous current disruptions; transversely magnetized plasma flow; Cathodes; Current measurement; Drives; Electrons; Laboratories; Magnetic field measurement; Plasma devices; Plasma measurements; Probes; Saturation magnetization;
fLanguage
English
Publisher
ieee
Conference_Titel
Plasma Science, 1997. IEEE Conference Record - Abstracts., 1997 IEEE International Conference on
Conference_Location
San Diego, CA, USA
ISSN
0730-9244
Print_ISBN
0-7803-3990-8
Type
conf
DOI
10.1109/PLASMA.1997.604867
Filename
604867
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