• DocumentCode
    1869389
  • Title

    Study of junction temperature effect on electrical power of light-emitting diode (LED) devices

  • Author

    Xuehui Tao ; Bin Yang

  • Author_Institution
    Dept. of Signal & Control Eng., Soochow Univ., Suzhou, China
  • fYear
    2015
  • fDate
    June 29 2015-July 2 2015
  • Firstpage
    430
  • Lastpage
    433
  • Abstract
    Junction temperature affects photometric and electrical performance of LED devices. In this paper, junction temperature effect on electrical power is investigated. The theoretical results and measurement results indicate the consumed electrical power of an LED device not only relates to injection current, but also depends on junction temperature. A mathematic model of electrical power of LED devices, considering the combined effect of junction temperature and injection current, is proposed. The proposed electrical power model has been verified with experimental measurements. It is helpful for LED performance evaluation.
  • Keywords
    light emitting diodes; mathematical analysis; semiconductor device measurement; semiconductor device models; LED; electrical performance; electrical power model; injection current; junction temperature effect; light-emitting diode; mathematic model; photometric performance; Current measurement; Junctions; Light emitting diodes; Mathematical model; Power systems; Temperature measurement; Voltage measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Physical and Failure Analysis of Integrated Circuits (IPFA), 2015 IEEE 22nd International Symposium on the
  • Conference_Location
    Hsinchu
  • Type

    conf

  • DOI
    10.1109/IPFA.2015.7224418
  • Filename
    7224418