Title : 
Reaction force inspection system using wavelet transforms and neural networks
         
        
            Author : 
Yamada, Yasuhiro ; Komura, Yoshiaki ; Masuda, Masanobu ; Ookubo, Yuuichi
         
        
            Author_Institution : 
Fukui Univ., Japan
         
        
        
        
        
        
        
            Abstract : 
Looks at a system for inspection of the quality of a probe´s reaction force characteristics. This system, until now considered difficult to realize, automates the inspection method utilizing the touching of an inspector´s finger. Wavelet transformation and a neural network (NN) approach are applied to the system for probes to learn an inspector´s finger judgment. We provide an input layer of a NN with thirty-three nodes corresponding to a time series of reaction forces of a probe and an output layer with one node corresponding to a judgment; being one of non-defective, defective, or unable to judge. From experimental results, the effectiveness of the system has been clarified
         
        
            Keywords : 
force measurement; inspection; neural nets; probes; time series; wavelet transforms; finger judgment; neural networks; probe reaction force characteristics; reaction force inspection system; time series; wavelet transforms; Costs; Fingers; Force measurement; Force sensors; Inspection; Motion measurement; Neural networks; Probes; Springs; Wavelet transforms;
         
        
        
        
            Conference_Titel : 
Robotics and Automation, 2002. Proceedings. ICRA '02. IEEE International Conference on
         
        
            Conference_Location : 
Washington, DC
         
        
            Print_ISBN : 
0-7803-7272-7
         
        
        
            DOI : 
10.1109/ROBOT.2002.1013617