• DocumentCode
    1869560
  • Title

    Sequentially stacked 3DIC technology using green nanosecond laser crystallization and laser spike annealing technologies

  • Author

    Chih-Chao Yang ; Tung-Ying Hsieh ; Wen-Hsien Huang ; Hsing-Hsiang Wang ; Chang-Hong Shen ; Jia-Min Shieh

  • Author_Institution
    Nat. Nano Device Labs., Hsinchu, Taiwan
  • fYear
    2015
  • fDate
    June 29 2015-July 2 2015
  • Firstpage
    389
  • Lastpage
    391
  • Abstract
    For 3D monolithic integrated (3DMI) technology, the most important task is to fabricate high performance stackable device and prevent damage on underlying device and structure during processes. In this article, we propose a green nanosecond laser crystallization and laser spike anneal process to fabricate 3D stackable ultra-thin body transistors and realize a sequentially layered integrated circuit. As identified, the possible failure mechanism of underlying device using laser process is the directly penetrated laser light and the heat from the high temperature surface. By optimizing the process conditions and stacking layer thickness, we can reduce the thickness of interlayer dielectric to about 200-nm-thin which quite reducing the delay and power loss from interconnects for 3DIC.
  • Keywords
    crystallisation; dielectric materials; integrated circuit reliability; integrated circuit testing; laser beam annealing; stacking; three-dimensional integrated circuits; transistors; 3D monolithic integrated technology; 3D stackable ultra-thin body transistors; 3DMI technology; failure mechanism; green nanosecond laser crystallization; interlayer dielectric; laser light; laser spike anneal process; laser spike annealing technologies; layered integrated circuit; power loss; stackable device; stacked 3DIC technology; stacking layer thickness; Crystallization; Films; Performance evaluation; Silicon; Surface treatment; Three-dimensional displays; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Physical and Failure Analysis of Integrated Circuits (IPFA), 2015 IEEE 22nd International Symposium on the
  • Conference_Location
    Hsinchu
  • Type

    conf

  • DOI
    10.1109/IPFA.2015.7224423
  • Filename
    7224423