Title :
Sequentially stacked 3DIC technology using green nanosecond laser crystallization and laser spike annealing technologies
Author :
Chih-Chao Yang ; Tung-Ying Hsieh ; Wen-Hsien Huang ; Hsing-Hsiang Wang ; Chang-Hong Shen ; Jia-Min Shieh
Author_Institution :
Nat. Nano Device Labs., Hsinchu, Taiwan
fDate :
June 29 2015-July 2 2015
Abstract :
For 3D monolithic integrated (3DMI) technology, the most important task is to fabricate high performance stackable device and prevent damage on underlying device and structure during processes. In this article, we propose a green nanosecond laser crystallization and laser spike anneal process to fabricate 3D stackable ultra-thin body transistors and realize a sequentially layered integrated circuit. As identified, the possible failure mechanism of underlying device using laser process is the directly penetrated laser light and the heat from the high temperature surface. By optimizing the process conditions and stacking layer thickness, we can reduce the thickness of interlayer dielectric to about 200-nm-thin which quite reducing the delay and power loss from interconnects for 3DIC.
Keywords :
crystallisation; dielectric materials; integrated circuit reliability; integrated circuit testing; laser beam annealing; stacking; three-dimensional integrated circuits; transistors; 3D monolithic integrated technology; 3D stackable ultra-thin body transistors; 3DMI technology; failure mechanism; green nanosecond laser crystallization; interlayer dielectric; laser light; laser spike anneal process; laser spike annealing technologies; layered integrated circuit; power loss; stackable device; stacked 3DIC technology; stacking layer thickness; Crystallization; Films; Performance evaluation; Silicon; Surface treatment; Three-dimensional displays; Transistors;
Conference_Titel :
Physical and Failure Analysis of Integrated Circuits (IPFA), 2015 IEEE 22nd International Symposium on the
Conference_Location :
Hsinchu
DOI :
10.1109/IPFA.2015.7224423