Title :
Enhanced thermal management for future processors
Author :
Ma, M. ; Gunther, S.H. ; Greiner, B. ; Wolff, N. ; Deutschle, C. ; Arabi, T.
Abstract :
An enhanced thermal management mechanism that reduces power by scaling frequency and voltage in response to excessive temperatures is presented. The voltage transition process is done transparently to the execution of applications. The enhanced mechanism achieves an /spl sim/50% power reduction while limiting the performance impact to only /spl sim/20% for the duration of the thermal event. The approach allows the processor to meet its performance and reliability goals without additional thermal solution costs.
Keywords :
reliability; temperature sensors; thermal management (packaging); enhanced thermal management; power reduction; processors; reliability; scaling frequency; transparent; voltage transition; Clocks; Costs; Energy consumption; Energy management; Frequency; Logic; Power generation; Temperature sensors; Thermal management; Voltage;
Conference_Titel :
VLSI Circuits, 2003. Digest of Technical Papers. 2003 Symposium on
Conference_Location :
Kyoto, Japan
Print_ISBN :
4-89114-034-8
DOI :
10.1109/VLSIC.2003.1221202