DocumentCode
1869875
Title
A novel sixport calibration incorporating diode detector non-linearity
Author
Judah, S.R. ; Holmes, W.
Author_Institution
Dept. of Electron. Eng., Hull Univ., UK
Volume
1
fYear
1998
fDate
18-21 May 1998
Firstpage
592
Abstract
This paper describes a calibration technique for sixports which incorporates diode non-linearity as part of the calibration procedure of the sixport itself. The calibration is based on five unit reflection standards and relaxes the constraint that all the denominator constants of the bi-linear transform have to be the same. This is to first order, a consequence of the nonlinearity of the diodes
Keywords
calibration; microwave reflectometry; nonlinear systems; optical delay lines; semiconductor diodes; bilinear transform; diode detector nonlinearity; reflection standards; reflectometers; six-port calibration; Bismuth; Calibration; Circuits; Diodes; Envelope detectors; Equations; Instruments; Phase measurement; Reflection; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Instrumentation and Measurement Technology Conference, 1998. IMTC/98. Conference Proceedings. IEEE
Conference_Location
St. Paul, MN
ISSN
1091-5281
Print_ISBN
0-7803-4797-8
Type
conf
DOI
10.1109/IMTC.1998.679861
Filename
679861
Link To Document