Title :
Improved technique for measuring complex reflection coefficients of microwave devices using only two power detectors
Author :
Yeo, S.P. ; Tay, S.T.
Author_Institution :
Dept. of Electr. Eng., Nat. Univ. of Singapore, Singapore
Abstract :
The paper describes an improved technique for measuring the complex reflection coefficients of microwave devices using the four-port multi-state reflectometer (which requires two power detectors and other commonly-available laboratory components). Simulation and experimental tests have confirmed that the prototype instrument (implemented in waveguide form) is able to yield measurement accuracies of within ±0.01 for magnitude and ±1° for phase
Keywords :
digital simulation; microwave reflectometry; reflectometers; complex reflection coefficients; experimental tests; four-port multi-state reflectometer; microwave devices; simulation; two power detectors; Detectors; Instruments; Laboratories; Microwave devices; Microwave measurements; Microwave theory and techniques; Power measurement; Reflection; Testing; Virtual prototyping;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1998. IMTC/98. Conference Proceedings. IEEE
Conference_Location :
St. Paul, MN
Print_ISBN :
0-7803-4797-8
DOI :
10.1109/IMTC.1998.679869
