Title :
Improved technique for measuring complex scattering coefficients of two-port microwave devices using only six power detectors
Author :
Yeo, S.P. ; Ang, C.K. ; Cheng, M.
Author_Institution :
Dept. of Electr. Eng., Nat. Univ. of Singapore, Singapore
Abstract :
The paper describes an improved technique for measuring the complex scattering coefficients of microwave two-port devices using the novel nine-port network analyzer. Tests on earlier prototypes of this instrument (comprising two symmetrical five-port junctions, six power detectors, two directional couplers and a phase shifter) have demonstrated that a re-arrangement of the inter-connections among the constituent components is able to yield an enhancement of performance (due to changes in the interaction of the waves within the system)
Keywords :
S-parameters; electric variables measurement; microwave reflectometry; network analysers; reflectometers; complex scattering coefficients; configuration; directional couplers; phase shifter; power detectors; symmetrical five-port junctions; two-port microwave devices; Detectors; Directional couplers; Instruments; Microwave devices; Microwave measurements; Microwave theory and techniques; Phase detection; Prototypes; Scattering; System testing;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1998. IMTC/98. Conference Proceedings. IEEE
Conference_Location :
St. Paul, MN
Print_ISBN :
0-7803-4797-8
DOI :
10.1109/IMTC.1998.679870