DocumentCode :
1870165
Title :
Interpretation of beneficial annealing of CIGSe cell buffured with co-evaporated In2S3
Author :
Laurencic, C. ; Buffière, M. ; Arzel, L. ; Barreau, N.
Author_Institution :
Inst. des Mater. Jean Rouxel (IMN), Univ. de Nantes, Nantes, France
fYear :
2011
fDate :
19-24 June 2011
Abstract :
The present contribution aims at better understanding the origin of the beneficial effect of the annealing of CIGSe-based solar cell buffered with co-evaporated (PVD)In2S3. For long, most of the works dealing with such alternatives to chemical bath deposited (CBD)CdS buffer layer have been focused on the CIGSe/buffer interface, where the pn junction is formed. Herein, we show that as already suggested by Nguyen et al. [1] in the case of (CBD)In2S3 buffer, the annealing post-treatment most probably improves the Voc and FF of the devices because it changes the nature and/or the density of defects at the In2S3/r-ZnO interface. Such a conclusion is motivated by our observation that rinsing the CIGSe/(PVD)In2S3 structures with water before the window deposition induces the same effect as the annealing, then such treated samples are less improved by annealing. In addition, the X-ray photoelectron spectroscopy analyses performed on the CIGSe/(PVD)In2S3 structure before and after the water treatment show that Na carbonates are removed from the surface by the water. This latter observation suggests that the main impact of the annealing of the cells buffered with co-evaporated In2S3 would be the destruction or the out migration of the Na-based compounds at the buffer/r-ZnO interface.
Keywords :
X-ray photoelectron spectra; annealing; copper compounds; indium compounds; solar cells; CIGSe cell; CuInGaSe2; In2S3; X-ray photoelectron spectroscopy; beneficial annealing; chemical bath deposition; co-evaporated In2S3; pn junction; post-treatment; water treatment; Annealing; Buffer layers; Copper; Performance evaluation; Photovoltaic cells; Surface treatment;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2011 37th IEEE
Conference_Location :
Seattle, WA
ISSN :
0160-8371
Print_ISBN :
978-1-4244-9966-3
Type :
conf
DOI :
10.1109/PVSC.2011.6186515
Filename :
6186515
Link To Document :
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