DocumentCode :
1870231
Title :
Variational Bayesian image processing on stochastic factor graphs
Author :
Li, Xin
Author_Institution :
Lane Dept. of Comput. Sci. & Electr. Eng., West Virginia Univ., Morgantown, WV
fYear :
2008
fDate :
12-15 Oct. 2008
Firstpage :
1748
Lastpage :
1751
Abstract :
In this paper, we present a patch-based variational Bayesian framework of image processing using the language of factor graphs (FGs). The variable and factor nodes of FGs represent image patches and their clustering relationship respectively. Unlike previous probabilistic graphical models, we model the structure of FGs by a latent variable, which gives the name "stochastic factor graphs"(SFGs). A sparsity-based prior is enforced to the local distribution functions at factor nodes, which leads to a class of variational expectation-maximization (VEM) algorithms on SFGs. VEM algorithms allow us to infer graph structure along with the target of inference from the observation data. This new framework can systematically exploit nonlocal dependency in natural images as justified by the experimental results in image denoising and inpainting applications.
Keywords :
Bayes methods; expectation-maximisation algorithm; graph theory; image processing; pattern clustering; probability; variational techniques; clustering relationship; graph structure; image denoising; image inpainting; local distribution functions; natural images; patch-based variational Bayesian framework; probabilistic graphical models; stochastic factor graphs; variational Bayesian image processing; variational expectation-maximization; Bayesian methods; Clustering algorithms; Computer science; Distribution functions; Graphical models; Image denoising; Image processing; Inference algorithms; Iterative algorithms; Stochastic processes; nonlocal dependency; patch-based models; sparsity priors; stochastic factor graphs; variational Bayesian inference;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Image Processing, 2008. ICIP 2008. 15th IEEE International Conference on
Conference_Location :
San Diego, CA
ISSN :
1522-4880
Print_ISBN :
978-1-4244-1765-0
Electronic_ISBN :
1522-4880
Type :
conf
DOI :
10.1109/ICIP.2008.4712113
Filename :
4712113
Link To Document :
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