• DocumentCode
    1870450
  • Title

    New methods for evaluating equalizer error rate performance

  • Author

    Smee, John E. ; Beaulieu, Norman C.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Queen´´s Univ., Kingston, Ont., Canada
  • Volume
    1
  • fYear
    1995
  • fDate
    25-28 Jul 1995
  • Firstpage
    87
  • Abstract
    A new method is presented to analytically determine the steady-state error rate performance of finite length linear equalization and decision feedback equalization (DFE). Usually the error rate performance for finite length equalization is bounded based on the mean square error (MSE) or worst case distortion. The exact expression for bit error rate (BER) performance determined assumes perfect channel estimation and is based on determining the pulse shape at the output of the equalizer. The effects of the residual intersymbol interference (ISI) and additive white Gaussian noise (AWGN) are considered. Thus linear equalization schemes can be analytically compared to DFE on the basis of error rate without simulation. The new error rate calculation for DFE can be applied to the Markov model of DFE error propagation to dramatically improve the characterization of DFE error propagation
  • Keywords
    Gaussian noise; Markov processes; decision feedback equalisers; error statistics; intersymbol interference; land mobile radio; least mean squares methods; radiofrequency interference; white noise; Markov model; additive white Gaussian noise; bit error rate; channel estimation; decision feedback equalization; equalizer error rate performance; error propagation; finite length linear equalization; mean square error; pulse shape; residual intersymbol interference; worst case distortion; AWGN; Bit error rate; Channel estimation; Decision feedback equalizers; Error analysis; Intersymbol interference; Mean square error methods; Performance analysis; Pulse shaping methods; Steady-state;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vehicular Technology Conference, 1995 IEEE 45th
  • Conference_Location
    Chicago, IL
  • ISSN
    1090-3038
  • Print_ISBN
    0-7803-2742-X
  • Type

    conf

  • DOI
    10.1109/VETEC.1995.504835
  • Filename
    504835