• DocumentCode
    1870806
  • Title

    Influence of AC interruption points on AC arc erosion of silver based contact materials

  • Author

    Nouri, H. ; Davies, T.S. ; Head, J.

  • Author_Institution
    Fac. of Eng., Univ. of West of England, Bristol, UK
  • fYear
    1998
  • fDate
    26-28 Oct. 1998
  • Firstpage
    207
  • Lastpage
    213
  • Abstract
    This paper presents experimental results obtained from a study into the reduction of contact erosion on break, using controlled AC point interruption principles. Five thousand break tests are carried out for a utilisation category of AC-1, at a current of 6 A rms, a gap-length of 2 mm on AgCdO (90%, 10%), AgCu3 (97%,3%) and Ag (fine, 99.9%) contacts, each with a diameter of 5 mm. The results show that by interrupting the circuit at selected points on the AC waveform, the rate of erosion varies significantly for different contact materials and the fine silver in general loses material. The minimum mass change for AgCdO is at interruption point /spl alpha/=135/spl deg/ and for AgCu3 surprisingly is at /spl alpha/=45/spl deg/. In the random break operation both AgCdO and fine Ag lose materials from both electrodes, but AgCu has an equal amount of material transfer. The paper also discusses the practical benefits of a controlled interruption technique within three-phase switching devices by incorporating a logic sequencer.
  • Keywords
    cadmium compounds; circuit-breaking arcs; copper alloys; electrical contacts; particle reinforced composites; silver; silver alloys; wear; 2 mm; 6 A; AC arc erosion; AC interruption points; AC waveform; Ag; AgCdO; AgCu; break tests; contact erosion; contact materials; controlled interruption technique; gap-length; logic sequencer; material transfer; minimum mass change; random break operation; rate of erosion; three-phase switching devices; Circuit breakers; Contacts; Control systems; Electric resistance; Electric variables control; Power electronics; Power system protection; Silver; Surface resistance; Switching circuits;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Contacts, 1998. Proceedings of the Forty-Fourth IEEE Holm Conference on
  • Conference_Location
    Arlington, VA, USA
  • Print_ISBN
    0-7803-4925-3
  • Type

    conf

  • DOI
    10.1109/HOLM.1998.722447
  • Filename
    722447