DocumentCode
1870927
Title
Boundary-scan: beyond production test
Author
Sedmark, R.M.
Author_Institution
Self-Test Services, Ambler, PA
fYear
1994
fDate
25-28 Apr 1994
Firstpage
415
Lastpage
420
Abstract
The use of boundary-scan, as specified in IEEE 1149.1-1990, has always been considered a source of major benefits for the production test process. However, there are many existing and potential applications of boundary-scan during other life cycle phases of a product-the design phase and field operation and support phase. This paper focuses on these additional phases of boundary-scan application
Keywords
boundary scan testing; built-in self test; integrated circuit testing; logic testing; production testing; BIST; IEEE 1149.1-1990; boundary-scan; design phase; field operation; life cycle phases; production test; support phase; Built-in self-test; Circuit testing; Connectors; Debugging; Emulation; Hardware; Production; Prototypes; Software prototyping; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium, 1994. Proceedings., 12th IEEE
Conference_Location
Cherry Hill, NJ
Print_ISBN
0-8186-5440-6
Type
conf
DOI
10.1109/VTEST.1994.292280
Filename
292280
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