DocumentCode :
1871007
Title :
MOS solar cells with oxides deposited by sol-gel processing
Author :
Huang, Chia-Hong ; Chang, Chung-Cheng ; Tsai, Jung-Hui
Author_Institution :
Dept. of Electron. Eng., Nat. Kaohsiung Normal Univ., Kaohsiung, Taiwan
fYear :
2011
fDate :
19-24 June 2011
Abstract :
It is proposed that the metal-oxide-semiconductor (MOS) solar cells with sol-gel oxides deposited by spin coating are produced in this study. This sol-gel-derived SiO2 layer is not very thin and the deviation in the thickness of the sol-gel layer is not slight. In general, the characteristics of MOS solar cells are significantly affected by the thickness of the SiO2 layer. Particularly, the thermal grown oxide thickness required is less than 2nm for MOS solar cell applications. It is useful for large-scale and large-amount manufacturing that the influence of nonuniformity of oxide thickness on the characteristics of MOS solar cells with sol-gel oxides is reduced. It is observed that the short-circuit current density (Jsc) of 15.56 mA/cm2, the open-circuit voltage (Voc) of 0.49V, the fill factor (FF) of 0.723 and the conversion efficiency (η%) of 5.44% are obtained by means of the current-voltage (I-V) measurements under AM 1.5 illumination at 25°C in the MOS solar cell with sol-gel oxides.
Keywords :
MIS structures; sol-gel processing; solar cells; spin coating; MOS solar cells; current-voltage measurements; deposition; fill factor; metal-oxide-semiconductor solar cells; sol-gel processing; spin coating; Coatings; Films; Lighting; P-n junctions; Photovoltaic cells; Substrates; Voltage measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2011 37th IEEE
Conference_Location :
Seattle, WA
ISSN :
0160-8371
Print_ISBN :
978-1-4244-9966-3
Type :
conf
DOI :
10.1109/PVSC.2011.6186547
Filename :
6186547
Link To Document :
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