• DocumentCode
    1871007
  • Title

    MOS solar cells with oxides deposited by sol-gel processing

  • Author

    Huang, Chia-Hong ; Chang, Chung-Cheng ; Tsai, Jung-Hui

  • Author_Institution
    Dept. of Electron. Eng., Nat. Kaohsiung Normal Univ., Kaohsiung, Taiwan
  • fYear
    2011
  • fDate
    19-24 June 2011
  • Abstract
    It is proposed that the metal-oxide-semiconductor (MOS) solar cells with sol-gel oxides deposited by spin coating are produced in this study. This sol-gel-derived SiO2 layer is not very thin and the deviation in the thickness of the sol-gel layer is not slight. In general, the characteristics of MOS solar cells are significantly affected by the thickness of the SiO2 layer. Particularly, the thermal grown oxide thickness required is less than 2nm for MOS solar cell applications. It is useful for large-scale and large-amount manufacturing that the influence of nonuniformity of oxide thickness on the characteristics of MOS solar cells with sol-gel oxides is reduced. It is observed that the short-circuit current density (Jsc) of 15.56 mA/cm2, the open-circuit voltage (Voc) of 0.49V, the fill factor (FF) of 0.723 and the conversion efficiency (η%) of 5.44% are obtained by means of the current-voltage (I-V) measurements under AM 1.5 illumination at 25°C in the MOS solar cell with sol-gel oxides.
  • Keywords
    MIS structures; sol-gel processing; solar cells; spin coating; MOS solar cells; current-voltage measurements; deposition; fill factor; metal-oxide-semiconductor solar cells; sol-gel processing; spin coating; Coatings; Films; Lighting; P-n junctions; Photovoltaic cells; Substrates; Voltage measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), 2011 37th IEEE
  • Conference_Location
    Seattle, WA
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4244-9966-3
  • Type

    conf

  • DOI
    10.1109/PVSC.2011.6186547
  • Filename
    6186547