An ASIC for the measurement of low frequency noise in MOS transistors

Cyclostationary (switched) operation of the MOS transistor has been proposed in recent years as a technique for reducing the flicker noise at the device level itself. Nevertheless accurate noise measurements covering a wide range of operation regions for the transistor are still required to support the proposed cyclostationary noise models. In this work, several noise measurement issues are discussed, and the development of an integrated circuit aimed at switched flicker noise measurements in different types/sizes of test transistors and at different bias conditions is presented. The proposed ASIC is a matrix of differential pairs (DUTs) connected to a GmC chopper-amplifier. The chopper modulators are disposed to amplify flicker noise from the DUTs while the remaining flicker noise sources in the circuit are cancelled.