DocumentCode
187113
Title
Non-contact conductance measurement of nanosize objects using reasonant cavity
Author
Obrzut, Jan ; Orloff, N. ; Kirilov, O.
Author_Institution
Mater. Meas. Lab., Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
fYear
2014
fDate
12-15 May 2014
Firstpage
816
Lastpage
818
Abstract
A cavity perturbation method is used to determine conductance of small volume nano-carbon materials. These are the building blocks of nanostructured materials and devices, and therefore their electrical characteristics are important in the materials development and production. Non-contact measurement is performed in WR-90 waveguide configuration in the X-band frequency band from 6 GHz to 12 GHz. The presented semi-empirical perturbation model correlates the experimental quality factor and the specimen volume with the specimen imaginary part of permittivity and conductance. The measurement is illustrated on conducting carbon nanotube films having volumes in the range of 10-5 cm3 and conductivity of 50 S/cm.
Keywords
Q-factor; carbon nanotubes; cavity resonators; conducting materials; electric admittance measurement; high-frequency effects; microwave materials; microwave measurement; nanocomposites; permittivity measurement; rectangular waveguides; thin film devices; WR-90 waveguide configuration; X-band frequency band; cavity perturbation method; conducting carbon nanotube films; electrical characteristics; experimental quality factor; frequency 6 GHz to 12 GHz; nanocarbon materials; nanosize object; nanostructured devices; nanostructured materials; noncontact conductance measurement; permittivity; resonant cavity; semiempirical perturbation model; specimen imaginary part; specimen volume; Cavity resonators; Conductivity; Frequency measurement; Materials; Microwave measurement; Microwave theory and techniques; Q-factor; carbon nanotubes; microwave conductivity; non contact measurement; resonant cavity;
fLanguage
English
Publisher
ieee
Conference_Titel
Instrumentation and Measurement Technology Conference (I2MTC) Proceedings, 2014 IEEE International
Conference_Location
Montevideo
Type
conf
DOI
10.1109/I2MTC.2014.6860856
Filename
6860856
Link To Document