Title :
Echo estimation-deriving simulation models for the mobile radio channel
Author_Institution :
Res. & Technol. Center, Deutsche Telekom A, Darmstadt, Germany
Abstract :
Soft- and hardware based simulators for the mobile radio channel are frequently used both during radio system development and for type approval. Most of these simulators rely on the generative GWSSUS model for the propagation properties of the channel. Up to now the model parameters have always been chosen in a heuristic manner. This paper deals with echo estimation to determine the GWSSUS parameters from the results of wide-band propagation measurements. The key steps of the method are the selection of the model order by a new statistical eigenvalue bound and the delay estimation by a new matrix pencil algorithm. The parameters of the scattering processes, i.e. the parametric representations of their Doppler power spectral densities and the power of deterministic components, are determined by standard algorithms. Its excellent performance makes the complete echo estimation scheme well-suited for the determination of representative channel parameters from measured data
Keywords :
cellular radio; deterministic algorithms; echo; eigenvalues and eigenfunctions; electromagnetic wave scattering; land mobile radio; parameter estimation; telecommunication channels; Doppler power spectral densities; channel parameters; channel propagation properties; delay estimation; deterministic components; echo estimation; generative GWSSUS model; hardware based simulators; matrix pencil algorithm; mobile radio channel; performance; radio system development; scattering processes; simulation models; software based simulators; standard algorithms; statistical eigenvalue bound; type approval; wide-band propagation measurements; Bandwidth; Eigenvalues and eigenfunctions; Electromagnetic propagation; Electromagnetic scattering; Frequency; Hardware; Land mobile radio; Propagation delay; Radio transmitters; Wideband;
Conference_Titel :
Vehicular Technology Conference, 1995 IEEE 45th
Conference_Location :
Chicago, IL
Print_ISBN :
0-7803-2742-X
DOI :
10.1109/VETEC.1995.504863