DocumentCode :
1871260
Title :
Linear finite state machine for lD ILAs
Author :
Gala, Murali M R ; Utama, Peter ; Ross, Don E. ; Watson, Karan L.
Author_Institution :
Dept. of Electr. Eng., Texas A&M Univ., College Station, TX, USA
fYear :
1994
fDate :
25-28 Apr 1994
Firstpage :
325
Lastpage :
332
Abstract :
Linear Finite State Machine for One Dimensional (1D) Iterative Logic Arrays (ILAs) is described. The technique for modifying the Linear Feedback Shift Register (LFSR) based test generator called Linear Finite State Machine (LFSM) for deterministic test pattern generation is discussed and extended for generating the test vectors for 1D unilateral ILAs. One Repetition Length (ORL) of C-testable ILAs and unique characteristics of the C-testable test patterns are used for the compact design of the LFSM based at-speed Built-in Self Test (BIST). Such LFSM based BIST occupies small silicon area, simplifies the design of the controller and does at-speed testing of the ILAs. This results in reduced time and cost of testing. In addition, the exact probability distribution equations are developed for additional bits needed to map a Finite State Machine (FSM) into an LFSM. The distribution clearly shows that the expected number of additional bits is very small, often zero. The probability distribution equations are equally valid for any LFSR based test generator for other circuits
Keywords :
built-in self test; deterministic automata; finite state machines; integrated circuit testing; logic arrays; logic testing; sequential circuits; shift registers; C-testable test patterns; at-speed testing; built-in self test; deterministic test pattern generation; iterative logic arrays; lD ILAs; linear feedback shift register; linear finite state machine; one repetition length; probability distribution equations; test generator; test vectors; Automata; Automatic testing; Built-in self-test; Circuit testing; Equations; Linear feedback shift registers; Logic arrays; Probability distribution; Test pattern generators; Vectors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Test Symposium, 1994. Proceedings., 12th IEEE
Conference_Location :
Cherry Hill, NJ
Print_ISBN :
0-8186-5440-6
Type :
conf
DOI :
10.1109/VTEST.1994.292293
Filename :
292293
Link To Document :
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