DocumentCode :
1871270
Title :
Wideband channel measurements at 900 MHz
Author :
Stewart, Kenneth A. ; Labedz, Gerald P. ; Sohrabi, Katayoun
Author_Institution :
Cellular Infrastructure Group, Motorola Inc., Arlington Heights, IL, USA
Volume :
1
fYear :
1995
fDate :
25-28 Jul 1995
Firstpage :
236
Abstract :
The paper describes RF channel measurements conducted in a mixed urban-suburban region of Bellevue, Washington using a BPSK DS-SS sounder with a bandwidth of 20 MHz (10 Mc/s) operating in the 915 MHz ISM band. The survey was used to study delay spread characteristics in a 1.23 MHz wide channel. The fast-fading envelope distribution of resolvable rays was found to vary between Rayleigh and Rician-distributed at 1.23 MHz bandwidth. At a higher bandwidth of 20 MHz the distribution was approximately Rician with a K-factor of 8-12 dB. It was estimated that a 4-finger, 2-port non-coherent IS-95 base station would make use of the second finger pair approximately 60% of the time. The differential delay between 1st and 2nd finger assignments was usually less than 8 μs, and there was little observable variation in the delay of the first-arriving multipath component between channel soundings spaced at 3 s intervals
Keywords :
Rayleigh channels; Rician channels; UHF radio propagation; broadband networks; cellular radio; delays; fading; land mobile radio; multipath channels; phase shift keying; pseudonoise codes; spread spectrum communication; 1.23 MHz; 20 MHz; 4-finger 2-port noncoherent IS-95 base station; 900 MHz; 915 MHz; 915 MHz ISM band; BPSK DS-SS sounder; Bellevue; Interstate-95; K-factor; RF channel measurements; United States; Washington; delay spread characteristics; fast-fading envelope distribution; mixed urban-suburban region; multipath component; wideband channel measurements; Band pass filters; Bandwidth; Base stations; Binary phase shift keying; Cutoff frequency; Delay; Low pass filters; Multiaccess communication; Radio frequency; Wideband;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vehicular Technology Conference, 1995 IEEE 45th
Conference_Location :
Chicago, IL
ISSN :
1090-3038
Print_ISBN :
0-7803-2742-X
Type :
conf
DOI :
10.1109/VETEC.1995.504864
Filename :
504864
Link To Document :
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