• DocumentCode
    1871299
  • Title

    Parameters influencing the contact compatibility of organic vapours in telecommunication and control switches

  • Author

    Koidl, Hermann P. ; Rieder, Werner F. ; Salzmann, Quido R.

  • Author_Institution
    Inst. of Switching Devices & High Voltage Technol., Univ. of Technol., Vienna, Austria
  • fYear
    1998
  • fDate
    26-28 Oct. 1998
  • Firstpage
    220
  • Lastpage
    225
  • Abstract
    The formation of carbon on contact surfaces of commercial switching devices for low power applications by thermal decomposition of organic vapours emanating from various organic materials may cause an undesirable increase of the contact resistance in the range of several Ohms. A specially developed test system and procedure is used to determine the contact compatibility of individual organic vapours: the contacts of a model switch are switching a well defined circuit in an atmosphere consisting of synthetic air and an increasing admixture of one organic vapour. The so called critical concentration is attained when well defined criteria of carbon contamination of the contacts become detectable. Previous investigations revealed that the contact compatibility of an organic vapour in combination with a certain contact material depends mainly on its chemical structure. The influence of the parameters oxygen concentration and humidity of the switching atmosphere, contact bouncing, and contact temperature on contact compatibility of individual organic vapours has been investigated systematically. The variation of these parameters showed the often rather strong influence on the effect and yielded more insight into the mechanism of contact carbonization.
  • Keywords
    carbon; contact resistance; electrical contacts; humidity; organic compounds; surface contamination; switches; telecommunication equipment; testing; C; C formation; O concentration; O/sub 2/; carbon contamination; commercial switching devices; contact bouncing; contact carbonization; contact compatibility; contact resistance; contact surfaces; contact temperature; control switches; critical concentration; low power applications; organic vapours; switching atmosphere humidity; telecommunication switches; test procedure; test system; thermal decomposition; Atmosphere; Circuit testing; Contact resistance; Organic materials; Surface resistance; Switches; Switching circuits; System testing; Thermal decomposition; Thermal resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Contacts, 1998. Proceedings of the Forty-Fourth IEEE Holm Conference on
  • Conference_Location
    Arlington, VA, USA
  • Print_ISBN
    0-7803-4925-3
  • Type

    conf

  • DOI
    10.1109/HOLM.1998.722449
  • Filename
    722449