DocumentCode :
1871299
Title :
Parameters influencing the contact compatibility of organic vapours in telecommunication and control switches
Author :
Koidl, Hermann P. ; Rieder, Werner F. ; Salzmann, Quido R.
Author_Institution :
Inst. of Switching Devices & High Voltage Technol., Univ. of Technol., Vienna, Austria
fYear :
1998
fDate :
26-28 Oct. 1998
Firstpage :
220
Lastpage :
225
Abstract :
The formation of carbon on contact surfaces of commercial switching devices for low power applications by thermal decomposition of organic vapours emanating from various organic materials may cause an undesirable increase of the contact resistance in the range of several Ohms. A specially developed test system and procedure is used to determine the contact compatibility of individual organic vapours: the contacts of a model switch are switching a well defined circuit in an atmosphere consisting of synthetic air and an increasing admixture of one organic vapour. The so called critical concentration is attained when well defined criteria of carbon contamination of the contacts become detectable. Previous investigations revealed that the contact compatibility of an organic vapour in combination with a certain contact material depends mainly on its chemical structure. The influence of the parameters oxygen concentration and humidity of the switching atmosphere, contact bouncing, and contact temperature on contact compatibility of individual organic vapours has been investigated systematically. The variation of these parameters showed the often rather strong influence on the effect and yielded more insight into the mechanism of contact carbonization.
Keywords :
carbon; contact resistance; electrical contacts; humidity; organic compounds; surface contamination; switches; telecommunication equipment; testing; C; C formation; O concentration; O/sub 2/; carbon contamination; commercial switching devices; contact bouncing; contact carbonization; contact compatibility; contact resistance; contact surfaces; contact temperature; control switches; critical concentration; low power applications; organic vapours; switching atmosphere humidity; telecommunication switches; test procedure; test system; thermal decomposition; Atmosphere; Circuit testing; Contact resistance; Organic materials; Surface resistance; Switches; Switching circuits; System testing; Thermal decomposition; Thermal resistance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Contacts, 1998. Proceedings of the Forty-Fourth IEEE Holm Conference on
Conference_Location :
Arlington, VA, USA
Print_ISBN :
0-7803-4925-3
Type :
conf
DOI :
10.1109/HOLM.1998.722449
Filename :
722449
Link To Document :
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