Title :
An industrial experience in the built-in self test of embedded RAMs
Author :
Camurati, P. ; Prinetto, P. ; Reorda, M. Sonza ; Barbagallo, S. ; Burri, A. ; Medina, D.
Author_Institution :
Dipartimento di Autom. e Inf., Politecnico di Torino, Italy
Abstract :
High-quality embedded memory testing is increasingly important and a BIST scheme seems advantageous. Industrial experience at Italtel, a telecom company, confirms it. The scheme implements in hardware the test pattern generation algorithm proposed by R. Nair, S.M. Thatte, and J.A. Abraham [1978], extending it to word-based memories. Several goodness criteria are satisfied, as the experimental results confirm
Keywords :
built-in self test; integrated circuit testing; integrated memory circuits; random-access storage; Italtel; built-in self test; embedded RAMs; embedded memory testing; goodness criteria; test pattern generation algorithm; word-based memories; Automatic testing; Built-in self-test; Communication industry; Decoding; Fault detection; Hardware; Random access memory; Read-write memory; Telecommunications; Test pattern generators;
Conference_Titel :
VLSI Test Symposium, 1994. Proceedings., 12th IEEE
Conference_Location :
Cherry Hill, NJ
Print_ISBN :
0-8186-5440-6
DOI :
10.1109/VTEST.1994.292296
