Analog circuit observer blocks

Author

Harjani, Ramesh ; Vinnakota, Rapiraju

Author_Institution

Dept. of Electr. Eng., Minnesota Univ., Minneapolis, MN, USA

fYear

1994

fDate

25-28 Apr 1994

Firstpage

258

Lastpage

263

Abstract

In addition to the traditional problems associated with testing ICs, analog circuit test is very susceptible to measurement induced errors. Precise calibration and signal matching are necessary to minimize these errors. These constraints increase the complexity and cost of analog circuit testers. In this paper, we introduce analog circuit observer blocks (ACOBs). ACOBs are designed to simplify test result observation in analog and mixed-signal ICs. Measurement errors are minimized since ACOBs are better matched to the circuits being tested and impose a lower load as well. If successful, they can reduce tester complexity. We present designs for ACOBs for a fully differential operational amplifier and a pipelined A/D converter

Keywords

analogue-digital conversion; fault location; integrated circuit testing; linear integrated circuits; mixed analogue-digital integrated circuits; operational amplifiers; ADC; analog circuit observer blocks; analog circuit testers; fault analysis; fully differential op amp; mixed-signal ICs; operational amplifier; pipelined A/D converter; signal matching; tester complexity; Analog circuits; Application specific integrated circuits; Circuit faults; Circuit testing; Costs; Dictionaries; Differential amplifiers; Mixed analog digital integrated circuits; Operational amplifiers; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

VLSI Test Symposium, 1994. Proceedings., 12th IEEE

Conference_Location

Cherry Hill, NJ

Print_ISBN

0-8186-5440-6

Type

conf

DOI

10.1109/VTEST.1994.292303

Filename

292303