Title :
Analog circuit observer blocks
Author :
Harjani, Ramesh ; Vinnakota, Rapiraju
Author_Institution :
Dept. of Electr. Eng., Minnesota Univ., Minneapolis, MN, USA
Abstract :
In addition to the traditional problems associated with testing ICs, analog circuit test is very susceptible to measurement induced errors. Precise calibration and signal matching are necessary to minimize these errors. These constraints increase the complexity and cost of analog circuit testers. In this paper, we introduce analog circuit observer blocks (ACOBs). ACOBs are designed to simplify test result observation in analog and mixed-signal ICs. Measurement errors are minimized since ACOBs are better matched to the circuits being tested and impose a lower load as well. If successful, they can reduce tester complexity. We present designs for ACOBs for a fully differential operational amplifier and a pipelined A/D converter
Keywords :
analogue-digital conversion; fault location; integrated circuit testing; linear integrated circuits; mixed analogue-digital integrated circuits; operational amplifiers; ADC; analog circuit observer blocks; analog circuit testers; fault analysis; fully differential op amp; mixed-signal ICs; operational amplifier; pipelined A/D converter; signal matching; tester complexity; Analog circuits; Application specific integrated circuits; Circuit faults; Circuit testing; Costs; Dictionaries; Differential amplifiers; Mixed analog digital integrated circuits; Operational amplifiers; Voltage;
Conference_Titel :
VLSI Test Symposium, 1994. Proceedings., 12th IEEE
Conference_Location :
Cherry Hill, NJ
Print_ISBN :
0-8186-5440-6
DOI :
10.1109/VTEST.1994.292303
