DocumentCode :
1871481
Title :
Pulsewidth dependence of laser damage in fused silica
Author :
An-Chun Tien ; Backus, S. ; Kapteyn, H. ; Murnane, M. ; Mourou, G.
Author_Institution :
Center for Ultrafast Optical Sci., Michigan Univ., Ann Arbor, MI, USA
fYear :
1999
fDate :
28-28 May 1999
Firstpage :
359
Abstract :
Summary form only given. The availability of ultrafast sub-50 fs lasers and the technology of chirped-pulse amplification have extended the study of the pulsewidth dependence of damage to ultrashort time scales. Various groups have reported two remarkable features of ultrashort pulse damage. First, short pulse damage exhibits a deterministic nature as opposed to the statistical behavior for long-pulse damage. Second, damage threshold fluence is higher than the prediction from the /spl radic//spl tau/ scaling rule for pulsewidth /spl tau/<10 ps. However, these measurements display different pulsewidth dependence of damage threshold in the subpicosecond regime. None of the theoretical models proposed before can explain this dissimilarity. The discrepancy among observations was thought to arise from different experimental conditions for instance, the number of laser shots. The sample may suffer a cumulative change in material properties as it is subjected to a series of subthreshold pulses. In order to study intrinsic laser damage, and to exclude the complexity of cumulative effects, our recent measurement was done under single-shot conditions.
Keywords :
high-speed optical techniques; laser beam effects; silicon compounds; 10 ps; 50 fs; SiO/sub 2/; chirped-pulse amplification; complexity; cumulative change; cumulative effects; damage threshold; damage threshold fluence; deterministic nature; dissimilarity; fused silica; intrinsic laser damage; laser damage; laser shots; long-pulse damage; material properties; pulsewidth; pulsewidth dependence; scaling rule; short pulse damage; single-shot conditions; statistical behavior; subpicosecond regime; subthreshold pulses; ultrafast sub-femtosecond lasers; ultrashort pulse damage; ultrashort time scales; Chirp; Displays; Laser modes; Laser theory; Material properties; Optical pulses; Pulse amplifiers; Pulse measurements; Silicon compounds; Space vector pulse width modulation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics, 1999. CLEO '99. Summaries of Papers Presented at the Conference on
Conference_Location :
Baltimore, MD, USA
Print_ISBN :
1-55752-595-1
Type :
conf
DOI :
10.1109/CLEO.1999.834302
Filename :
834302
Link To Document :
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