DocumentCode
1871746
Title
Quality impacts of non-uniform fault coverage
Author
Maxwell, Peter C.
Author_Institution
Integrated Circuits Business Div., Hewlett-Packard Co., Palo Alto, CA, USA
fYear
1994
fDate
25-28 Apr 1994
Firstpage
197
Lastpage
200
Abstract
This paper addresses the issue of non-uniform distribution of detected faults. It is shown that there is a very big difference in final quality between covering the chip all over and leaving parts relatively untested, even if the coverage is the same in both cases
Keywords
fault location; integrated circuit testing; probability; quality control; IC testing; nonuniform distribution; nonuniform fault coverage; quality level; Circuit faults; Circuit testing; Companies; Electrical fault detection; Fault detection; Integrated circuit technology; Integrated circuit testing;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium, 1994. Proceedings., 12th IEEE
Conference_Location
Cherry Hill, NJ
Print_ISBN
0-8186-5440-6
Type
conf
DOI
10.1109/VTEST.1994.292313
Filename
292313
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