Title :
Coverage metrics for functional tests
Author :
Wallack, John R. ; Dandapani, Ramaswami
Author_Institution :
Martin Marietta Astronaut. Group, Denver, CO, USA
Abstract :
Describes test quality measures that quantify the completeness of a functional test. The measures are based on exercising a functional model of the unit with the given set of test sequences. Two metrics are proposed: the control-flow coverage (FC1) indicates how completely the logical flow of the functional model is traversed, and the data path coverage (FC2) indicates how completely the data paths have been exercised over a specified set of observable values. The metrics were evaluated using an RTL model of a RISC processor and a combinational circuit
Keywords :
combinatorial circuits; logic testing; reduced instruction set computing; specification languages; RISC processor; RTL model; combinational circuit; control-flow coverage; data path coverage; functional model; functional tests; logic verification; observable values; test quality measures; test sequences; Circuit testing; Counting circuits; Extraterrestrial measurements; Flow graphs; Flowcharts; Hardware design languages; Reduced instruction set computing; Software measurement; Software testing; Springs;
Conference_Titel :
VLSI Test Symposium, 1994. Proceedings., 12th IEEE
Conference_Location :
Cherry Hill, NJ
Print_ISBN :
0-8186-5440-6
DOI :
10.1109/VTEST.1994.292317
