DocumentCode
1871862
Title
Coverage metrics for functional tests
Author
Wallack, John R. ; Dandapani, Ramaswami
Author_Institution
Martin Marietta Astronaut. Group, Denver, CO, USA
fYear
1994
fDate
25-28 Apr 1994
Firstpage
176
Lastpage
181
Abstract
Describes test quality measures that quantify the completeness of a functional test. The measures are based on exercising a functional model of the unit with the given set of test sequences. Two metrics are proposed: the control-flow coverage (FC1) indicates how completely the logical flow of the functional model is traversed, and the data path coverage (FC2) indicates how completely the data paths have been exercised over a specified set of observable values. The metrics were evaluated using an RTL model of a RISC processor and a combinational circuit
Keywords
combinatorial circuits; logic testing; reduced instruction set computing; specification languages; RISC processor; RTL model; combinational circuit; control-flow coverage; data path coverage; functional model; functional tests; logic verification; observable values; test quality measures; test sequences; Circuit testing; Counting circuits; Extraterrestrial measurements; Flow graphs; Flowcharts; Hardware design languages; Reduced instruction set computing; Software measurement; Software testing; Springs;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium, 1994. Proceedings., 12th IEEE
Conference_Location
Cherry Hill, NJ
Print_ISBN
0-8186-5440-6
Type
conf
DOI
10.1109/VTEST.1994.292317
Filename
292317
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