DocumentCode :
1871919
Title :
Detailed analysis of I/O traces for large scale applications
Author :
Nakka, N. ; Choudhary, A. ; Liao, W.K. ; Ward, L. ; Klundt, R. ; Weston, M.I.
Author_Institution :
Electr. Eng. & Comput. Sci., Northwestern Univ., Evanston, IL, USA
fYear :
2009
fDate :
16-19 Dec. 2009
Firstpage :
419
Lastpage :
427
Abstract :
In this paper, we present a tool to extract I/O traces from very large applications running at full scale during their production runs. We analyze these traces to gain information about the application. We analyze the traces of three applications. The analysis showed that the I/O traces reveal much information about the application even without access to the source code. In particular, these I/O traces provide multiple indications towards the algorithmic nature of the application by observing the changes of data amount and I/O request distribution at the checkpoints. Adaptive Mesh Refinement (AMR) is one of the kind of algorithms that can exhibit such I/O behavior. This is the first study of I/O characteristics of unbalanced AMR-supported applications at scale. The key observations that we made in the trace were (1) Variation in aggregate data sizes across checkpoints for AMR and non-AMR applications, (2) Variation in the number of I/O calls by a client depending on the nature of the application, (3) Use of temporary files by applications and possible erroneous calls to I/O functions, (4) Variation in average data transfer size according as whether the application has AMR support or not, (5) Aggregation of I/O for processes executing on a single physical node through MPI-IO calls, and (6) Updates to specific data structures in the checkpoint file.
Keywords :
distributed processing; input-output programs; I/O calls variation; I/O traces; adaptive mesh refinement; aggregate data size variation; checkpoint file; data structure update; data transfer size variation; large scale applications; processes execution aggregation; temporary files usage; Adaptive mesh refinement; Application software; Computer science; Data mining; File systems; Information analysis; Laboratories; Large-scale systems; Operating systems; Production; I/O trace analysis; Large scale I/O tracing; adaptive mesh refinement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
High Performance Computing (HiPC), 2009 International Conference on
Conference_Location :
Kochi
Print_ISBN :
978-1-4244-4922-4
Electronic_ISBN :
978-1-4244-4921-7
Type :
conf
DOI :
10.1109/HIPC.2009.5433186
Filename :
5433186
Link To Document :
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