DocumentCode
1871947
Title
A model for mean-time-to-repair and mean-logistics-delay-time at the system level
Author
Wing, Thomas E. ; Crow, Larry H.
Author_Institution
AT&T Bell Lab., Whippany, NJ, USA
fYear
1990
fDate
23-25 Jan 1990
Firstpage
389
Lastpage
393
Abstract
A method is presented for calculating the operational availability, mean time between failures (MTBF), mean time to repair (MTTR), and mean logistic delay time (MLDT) of a system, given the MTBF, MTTR, and MLDT of the lowest replaceable units (LRUs). The method is applicable to systems that undergo operating and nonoperating periods for an indefinite time. Development of the method required extension of the definitions of MTTR and MLDT at the LRU level to the system level. The method of calculating the system level parameters used a model to calculate inherent ability as an intermediate step. An example is presented that demonstrated a computer program suitable for use by a RAM engineer on design and development projects
Keywords
failure analysis; maintenance engineering; reliability; RAM; availability; lowest replaceable units; maintainability; mean time between failures; mean-logistics-delay-time; mean-time-to-repair; model; reliability; system level parameters; Availability; Control systems; Delay effects; Delay systems; Equations; Logistics; Read-write memory; Redundancy; Steady-state; Tree data structures;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability and Maintainability Symposium, 1990. Proceedings., Annual
Conference_Location
Los Angeles, CA
Type
conf
DOI
10.1109/ARMS.1990.67989
Filename
67989
Link To Document