DocumentCode :
1871998
Title :
Stress relaxation of aluminum wire conductors
Author :
Braunovic, M.
Author_Institution :
MB Interface, Montreal, Que., Canada
fYear :
1998
fDate :
26-28 Oct. 1998
Firstpage :
239
Lastpage :
251
Abstract :
Published experimental evidence and various reports of trouble in service suggest that the contact stability of aluminum wire connections is sometimes inadequate. Among a number of factors affecting the contact stability is a rather rapid stress relaxation of aluminum which can significantly reduce the contact stability. Stress relaxation behaviour of EC-1350 H12 and NUAL-H12 grade wire conductors was evaluated at 100/spl deg/C and under current-cycling conditions. In addition, the contact resistance behavior of these wire conductors in a binding-head screw under the influence of electrical current was also investigated. It was shown that the stress relaxation of EC-1350 grade aluminum wire and its contact resistance behaviour in a binding-head screw configuration is inferior to that of the NUAL wire conductor. Current-cycling carried out at room temperature at was found to produce as much stress relaxation as that carried out at 100/spl deg/C and much higher initial contact loads.
Keywords :
contact resistance; electrical contacts; stability; stress relaxation; wires (electric); 100 degC; Al; NUAL wire conductor; aluminum wire conductors; binding-head screw; contact resistance behavior; contact stability; current-cycling conditions; electrical current; initial contact loads; stress relaxation; Aluminum; Conductors; Connectors; Contact resistance; Creep; Current; Residual stresses; Stability; Temperature; Wire;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Contacts, 1998. Proceedings of the Forty-Fourth IEEE Holm Conference on
Conference_Location :
Arlington, VA, USA
Print_ISBN :
0-7803-4925-3
Type :
conf
DOI :
10.1109/HOLM.1998.722452
Filename :
722452
Link To Document :
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