Title :
A BIST technique for a frequency response and intermodulation distortion test of a sigma-delta ADC
Author :
Toner, M.F. ; Roberts, G.W.
Author_Institution :
Dept. of Electr. Eng., McGill Univ., Montreal, Que., Canada
Abstract :
Built-in-self-test (BIST) for VLSI systems is desirable for production-time testing and in the field diagnostics. This paper discusses a Mixed Analog Digital BIST (MADBIST) for a frequency response test and an intermodulation distortion test of an Analog-to-Digital converter. The MADBIST strategy for the FR and IMD tests of the ADC is introduced, accuracy issues are discussed, and preliminary experimental results are presented
Keywords :
VLSI; analogue-digital conversion; built-in self test; delta modulation; frequency response; integrated circuit testing; intermodulation; mixed analogue-digital integrated circuits; production testing; BIST technique; IMD tests; MADBIST; VLSI systems; accuracy issues; analog-to-digital converter; frequency response; intermodulation distortion test; mixed analog digital BIST; production-time testing; sigma-delta ADC; Analog-digital conversion; Automatic testing; Built-in self-test; Circuit testing; Costs; Delta-sigma modulation; Digital-analog conversion; Frequency response; Intermodulation distortion; System testing;
Conference_Titel :
VLSI Test Symposium, 1994. Proceedings., 12th IEEE
Conference_Location :
Cherry Hill, NJ
Print_ISBN :
0-8186-5440-6
DOI :
10.1109/VTEST.1994.292333
