Title :
Proceedings of IEEE VLSI Test Symposium
Abstract :
The following topics were dealt with: synthesis and testability; testable mixed-signal circuit designs; built-in self-test; test generation and fault simulation; online testing; defect coverage and test quality; high-level mixed signal test; delay fault testing; regular structure testing; design verification and manufacturing validation; IDDQ testing and bridging faults; testability concepts and applications; fault modeling
Keywords :
VLSI; automatic testing; built-in self test; design for testability; integrated circuit testing; logic testing; mixed analogue-digital integrated circuits; IDDQ testing; VLSI test; bridging faults; built-in self-test; circuit synthesis; defect coverage; delay fault testing; design for test; design verification; fault modeling; fault simulation; high-level mixed signal test; manufacturing validation; mixed-signal circuit designs; online testing; regular structure testing; test generation; test quality; testability;
Conference_Titel :
VLSI Test Symposium, 1994. Proceedings., 12th IEEE
Conference_Location :
Cherry Hill, NJ, USA
Print_ISBN :
0-8186-5440-6
DOI :
10.1109/VTEST.1994.292343
