Title :
Parameter uncertainty in the Sandia Array Performance Model for flat-plate crystaline silicon modules
Author :
Hansen, Clifford ; Stein, Joshua ; Miller, Steven ; Boyson, William ; Kratochvil, Jay ; King, David L.
Author_Institution :
Sandia Nat. Labs., Albuquerque, NM, USA
Abstract :
The Sandia Array Performance Model (SAPM) [1] describes the power performance of photovoltaic (PV) modules under variable irradiance and temperature conditions. Model parameters are estimated by regressions involving measured module voltage and current, module and air temperature, and solar irradiance. Measurements are made under test conditions chosen to isolate subsets of parameters and which improve the quality of the regression estimates. Uncertainty in model parameters results from uncertainty in each measurement as well as from the number of measurements. Uncertainty in model parameters can be propagated through the model to determine its effect on model output. In this paper we summarize the process for estimating uncertainty in model parameters for flat-plate, crystalline silicon (cSi) modules from measurements, present example results, and illustrate the effect of parameter uncertainty on model output. Finally, we comment on how analysis of parameter uncertainty can inform model developers about the presence and impacts of model uncertainty.
Keywords :
parameter estimation; photovoltaic cells; regression analysis; silicon; solar cell arrays; solar radiation; SAPM; Sandia array performance model; Si; air temperature; crystalline silicon modules; flat-plate crystaline silicon modules; model parameters; module current; module voltage; parameter analysis; parameter uncertainty; photovoltaic modules power performance; regression estimates; solar irradiance; test conditions; uncertainty estimation; variable irradiance conditions; variable temperature conditions; Correlation; Current measurement; Mathematical model; Temperature measurement; Uncertain systems; Uncertainty; Voltage measurement;
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2011 37th IEEE
Conference_Location :
Seattle, WA
Print_ISBN :
978-1-4244-9966-3
DOI :
10.1109/PVSC.2011.6186607