Title :
Development of a test station for accurate in situ I-V curve measurements of photovoltaic modules in Southern Norway
Author :
Imenes, A.G. ; Yordanov, G.H. ; Midtgård, O.M. ; Saetre, T.O.
Author_Institution :
Fac. of Eng. & Sci., Univ. of Agder, Grimstad, Norway
Abstract :
The development of an outdoor test station for accurate in situ I-V curve measurements of photovoltaic (PV) modules is described. The modules are installed in an open-rack configuration at the University of Agder in Southern Norway. Seven new and three aged PV modules of different type and make are being tested, including mono-and multicrystalline silicon from differing manufacturing routes, triple-junction amorphous silicon, and CIS. Data acquisition is controlled with a multichannel electronic load system and LabVIEW software, recording high-resolution I-V curves at one-minute intervals. Between I-V curve sweeps, each module is operated at the maximum power point. Characteristic electrical parameters are extracted and stored together with values of module temperatures and in-plane solar irradiance, the latter recorded at sub-second resolution. The paper describes the experimental set-up in more detail, discusses some local environmental effects, and presents a sample of test results.
Keywords :
amorphous semiconductors; data acquisition; elemental semiconductors; maximum power point trackers; silicon; solar cells; sunlight; virtual instrumentation; CIS; LabVIEW software; PV modules; data acquisition; environmental effects; high-resolution l-V curves; in situ l-V curve measurements; in-plane solar irradiance; manufacturing routes; maximum power point; monocrystalline silicon; multichannel electronic load system; multicrystalline silicon; open-rack configuration; photovoltaic modules; subsecond resolution; test station development; triple-junction amorphous silicon; Current measurement; Monitoring; Silicon; Snow; Temperature; Temperature measurement; Temperature sensors;
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2011 37th IEEE
Conference_Location :
Seattle, WA
Print_ISBN :
978-1-4244-9966-3
DOI :
10.1109/PVSC.2011.6186610