DocumentCode :
1872739
Title :
The future of RTP, a technology that can change the IC fab industry
Author :
Mattson, Brad ; Timans, Paul ; Tay, Sing-Pin ; Devine, Daniel J. ; Kim, Jung
Author_Institution :
Mattson Technol., Fremont, CA, USA
fYear :
2001
fDate :
2001
Firstpage :
13
Lastpage :
27
Abstract :
RTP presents a unique opportunity for the semiconductor industry. By completing the transition to RTP as we enter the 300 mm-era, the industry can seize the opportunity for significant improvements in cycle-time, in thermal budget minimization and in process performance. This paper examines how RTP has evolved to meet these challenges and describes the state-of-the-art of RTP technology today. The poor throughput performance of 300 mm batch furnaces, the risk of misprocessing large batches of very valuable wafers and the inflexibility of the furnace in an era when cycle-time is paramount all signal the end of large-batch thermal processing within this decade.
Keywords :
integrated circuit manufacture; rapid thermal processing; reviews; 300 mm; IC manufacture; RTP technology; Si; Si device processing; cycle-time improvement; process performance improvement; rapid thermal processing; thermal budget minimization; throughput performance; Control systems; Dielectrics; Electrical equipment industry; Furnaces; Manufacturing processes; Production systems; Technological innovation; Temperature control; Temperature measurement; Thermal stresses;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Advanced Thermal Processing of Semiconductors 9th Internationa Conference on RTP 2001
Print_ISBN :
0-9638251-0-4
Type :
conf
DOI :
10.1109/RTP.2001.1013741
Filename :
1013741
Link To Document :
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