• DocumentCode
    1872800
  • Title

    Integrated Inductors in HR SOI CMOS technologies: on the economic advantage of SOI technologies for the integration of RF applications

  • Author

    Gianesello, F. ; Gloria, D. ; Raynaud, C. ; Montusclat, S. ; Boret, S. ; Touret, P.

  • Author_Institution
    STMicroelectron., Crolles
  • fYear
    2007
  • fDate
    1-4 Oct. 2007
  • Firstpage
    119
  • Lastpage
    120
  • Abstract
    This paper presents high-Q and high-inductance-density on-chip inductors made on high resistivity (HR) substrate using STMicroelectronics LP 65 nm SOI CMOS technology with 6 copper metal layers. For the first time, on-chip inductor architectures dedicated to HR SOI CMOS technology are reported and benchmarked with current one used in standard RF CMOS technologies. According to the measurement results, proposed 3D HR SOI inductor occupies only 50% of the area of the conventional planar spiral inductor with the same inductance and similar quality factor. By virtue of the small area consumed by those 3D inductors, the size and cost of the radio frequency (RF) chip integrated on HR SOI can be significantly reduced in comparison with standard bulk technology which reenforces the advantage of SOI technology for RF applications.
  • Keywords
    CMOS integrated circuits; inductors; integrated circuit technology; radiofrequency integrated circuits; silicon-on-insulator; 3D inductor; HR SOI CMOS technology; RF applications; STMicroelectronics; high resistivity substrate; high-Q on-chip inductors; high-inductance-density on-chip inductors; integrated inductors; size 65 nm; Area measurement; CMOS technology; Conductivity; Copper; Inductance measurement; Inductors; Q factor; Radio frequency; Semiconductor device measurement; Spirals;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    SOI Conference, 2007 IEEE International
  • Conference_Location
    Indian Wells, CA
  • ISSN
    1078-621X
  • Print_ISBN
    978-1-4244-0879-5
  • Electronic_ISBN
    1078-621X
  • Type

    conf

  • DOI
    10.1109/SOI.2007.4357881
  • Filename
    4357881