DocumentCode
1872800
Title
Integrated Inductors in HR SOI CMOS technologies: on the economic advantage of SOI technologies for the integration of RF applications
Author
Gianesello, F. ; Gloria, D. ; Raynaud, C. ; Montusclat, S. ; Boret, S. ; Touret, P.
Author_Institution
STMicroelectron., Crolles
fYear
2007
fDate
1-4 Oct. 2007
Firstpage
119
Lastpage
120
Abstract
This paper presents high-Q and high-inductance-density on-chip inductors made on high resistivity (HR) substrate using STMicroelectronics LP 65 nm SOI CMOS technology with 6 copper metal layers. For the first time, on-chip inductor architectures dedicated to HR SOI CMOS technology are reported and benchmarked with current one used in standard RF CMOS technologies. According to the measurement results, proposed 3D HR SOI inductor occupies only 50% of the area of the conventional planar spiral inductor with the same inductance and similar quality factor. By virtue of the small area consumed by those 3D inductors, the size and cost of the radio frequency (RF) chip integrated on HR SOI can be significantly reduced in comparison with standard bulk technology which reenforces the advantage of SOI technology for RF applications.
Keywords
CMOS integrated circuits; inductors; integrated circuit technology; radiofrequency integrated circuits; silicon-on-insulator; 3D inductor; HR SOI CMOS technology; RF applications; STMicroelectronics; high resistivity substrate; high-Q on-chip inductors; high-inductance-density on-chip inductors; integrated inductors; size 65 nm; Area measurement; CMOS technology; Conductivity; Copper; Inductance measurement; Inductors; Q factor; Radio frequency; Semiconductor device measurement; Spirals;
fLanguage
English
Publisher
ieee
Conference_Titel
SOI Conference, 2007 IEEE International
Conference_Location
Indian Wells, CA
ISSN
1078-621X
Print_ISBN
978-1-4244-0879-5
Electronic_ISBN
1078-621X
Type
conf
DOI
10.1109/SOI.2007.4357881
Filename
4357881
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