Title :
A new serial search acquisition approach with automatic decision threshold control
Author_Institution :
Nokia Mobile Phones Inc., San Diego, CA, USA
Abstract :
A new approach to pseudo noise (PN) code acquisition for a code division multiple access (CDMA) direct sequence spread spectrum system is presented and analyzed. The new approach adaptively estimates the optimal threshold by exploiting the signal and noise statistics, uses the threshold to make a decision to stop or to continue the search process by employing pre-verification logic, and obtains fast acquisition. The paper also develops the mean acquisition time of the new algorithm and illustrates the optimum system parameter design methodology through a performance analysis. The considerable advantage of this approach compared to conventional approaches is demonstrated. By combining the maximum likelihood approach with a serial search approach, a faster acquisition is achieved. The new acquisition system uses, in each dwell, an adaptive signal detection threshold for signal detection and an adaptive signal classification threshold for classifying a signal versus noise
Keywords :
adaptive estimation; adaptive signal detection; code division multiple access; maximum likelihood detection; pseudonoise codes; search problems; spread spectrum communication; CDMA; adaptive estimation; adaptive signal classification; adaptive signal detection; automatic decision threshold control; code division multiple access; direct sequence spread spectrum system; fast acquisition; maximum likelihood approach; mean acquisition time; noise statistics; optimal threshold; optimum system parameter design; performance analysis; preverification logic; pseudonoise code acquisition; serial search acquisition; signal statistics; Adaptive signal detection; Design methodology; Logic; Maximum likelihood detection; Maximum likelihood estimation; Multiaccess communication; Performance analysis; Signal processing; Spread spectrum communication; Statistics;
Conference_Titel :
Vehicular Technology Conference, 1995 IEEE 45th
Conference_Location :
Chicago, IL
Print_ISBN :
0-7803-2742-X
DOI :
10.1109/VETEC.1995.504925