• DocumentCode
    1873013
  • Title

    Accelerated aging tests on PV grounding connections

  • Author

    Wang, Ethan ; Yen, Kai-Hsiang ; Wang, Carl ; Ji, Liang ; Zgonena, Timothy

  • Author_Institution
    Underwriters Labs. Taiwan Co., Taipei, Taiwan
  • fYear
    2011
  • fDate
    19-24 June 2011
  • Abstract
    As many contemporary Photovoltaic (PV) Power systems being installed are designed to produce significant amount of electricity and claimed to operate for 25 years or more, appropriate grounding on PV modules to reduce or eliminate shock and fire hazards becomes a critical issue under high electricity output and long-term use. Although some PV manufacturers have provided technical bulletins to suggest grounding products and methods, not all of them have been carefully evaluated and reviewed by the certification/listing laboratories. In this paper, different types of PV grounding connectors were collected, installed and put into accelerated environmental test chambers. The effects of current cycling, assembly force, anti-oxidation coating application on grounding reliability were evaluated. The grounding failure modes and mechanisms are also discussed in this paper.
  • Keywords
    ageing; earthing; electric shocks; environmental testing; hazards; life testing; photovoltaic power systems; power generation reliability; PV grounding connection; PV manufacturer; PV power system; accelerated aging testing; accelerated environmental test chamber; antioxidation coating application; assembly force; certification-listing laboratory; current cycling effect; fire hazard elimination; fire hazard reduction; grounding reliability; photovoltaic power system; shock elimination; shock reduction; time 25 year; Aging; Aluminum; Compounds; Connectors; Corrosion; Fasteners; Grounding;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), 2011 37th IEEE
  • Conference_Location
    Seattle, WA
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4244-9966-3
  • Type

    conf

  • DOI
    10.1109/PVSC.2011.6186629
  • Filename
    6186629