DocumentCode :
1873031
Title :
Enhancement of fast-flow underfill performance by use of silane additives
Author :
Vincent, M.B. ; Wong, C.P.
Author_Institution :
Sch. of Mater. Sci. & Eng., Georgia Inst. of Technol., Atlanta, GA, USA
fYear :
1998
fDate :
15-18 Mar 1998
Firstpage :
16
Lastpage :
20
Abstract :
A challenge in flip-chip technology development is to improve the thermo-mechanical reliability of the flip-chip assembly. To increase reliability, an underfill encapsulant is applied to the gap between die and substrate to provide thermal-mechanical protection as well as environmental protection to the assembly. The fast-flow method is currently the most widely used method for applying the underfill to the gap. This method dispenses the underfill along one or two sides of the die and allows the underfill to fill the gap by capillary flow. There are two major opportunities for improvement of the fast-flow method of underfilling: flow time and cure time. This paper presents work on enhancement of the underfill viscosity and wetting properties by silane coupling agents to decrease the time to underfill the die. Viscosity, contact angle measurements, and flow time in a simulated flip-chip are used to test the effects of the additives in the underfill
Keywords :
capillarity; contact angle; encapsulation; flip-chip devices; integrated circuit packaging; integrated circuit reliability; viscosity; wetting; capillary flow; contact angle; coupling agents; cure time; environmental protection; fast-flow underfill performance; flip-chip technology; flow time; silane additives; thermal-mechanical protection; thermo-mechanical reliability; viscosity; wetting properties; Assembly; Costs; Equations; Packaging; Protection; Surface contamination; Surface tension; Thermal stresses; Thermomechanical processes; Viscosity;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Advanced Packaging Materials, 1998. Proceedings. 1998 4th International Symposium on
Conference_Location :
Braselton, GA
Print_ISBN :
0-7803-4795-1
Type :
conf
DOI :
10.1109/ISAPM.1998.664427
Filename :
664427
Link To Document :
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