Title :
22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems - Title
Abstract :
The following topics are dealt with: VLSI; fault tolerance; defects; network-on-chip; system-on-chip; reliability analysis; fault injection; testing; design for testability; soft errors; semiconductor memories; storage system; and integrated circuit technologies.
Keywords :
VLSI; design for testability; fault tolerance; integrated circuit design; integrated circuit reliability; integrated circuit technology; integrated circuit testing; integrated memory circuits; network-on-chip; VLSI; defects; design for testability; fault injection; fault tolerance; integrated circuit technologies; network-on-chip; reliability analysis; semiconductor memories; soft errors; storage system; system-on-chip; testing;
Conference_Titel :
Defect and Fault-Tolerance in VLSI Systems, 2007. DFT '07. 22nd IEEE International Symposium on
Conference_Location :
Rome
Print_ISBN :
978-0-7695-2885-4
