Title :
Estimating Error Propagation Probabilities with Bounded Variances
Author :
Asadi, Hossein ; Tahoori, Mehdi B. ; Tirumurti, Chandra
Author_Institution :
Northeastern Univ., Boston
Abstract :
Fast and accurate estimation of soft error rate (SER) is essential in obtaining the reliability parameters of a digital system and cost-effective reliability improvements. In this paper we present an approach to obtain uncertainty bounds on the error propagation probability (EPP) values used in SER estimation based on an analytical approach. We demonstrate how we can compute EPP values and their uncertainty bounds (variances) by examining the logic gates in a topological order. Comparison of this method with the Monte-Carlo (MC) fault simulation approach confirms the accuracy of the presented technique for both the computed EPP values and uncertainty bounds. Also, this technique is 3-5 orders of magnitude faster than fault simulation.
Keywords :
Monte Carlo methods; error statistics; logic circuits; Monte-Carlo fault simulation; bounded variances; cost-effective reliability improvements; digital system; error propagation probability; estimating error propagation probabilities; soft error rate; uncertainty bounds; Analytical models; Circuit faults; Circuit simulation; Computational modeling; Error analysis; Signal analysis; Single event transient; Space technology; Uncertainty; Very large scale integration;
Conference_Titel :
Defect and Fault-Tolerance in VLSI Systems, 2007. DFT '07. 22nd IEEE International Symposium on
Conference_Location :
Rome
Print_ISBN :
978-0-7695-2885-4
DOI :
10.1109/DFT.2007.51