An automated segmentation for nickel-based superalloy

Author

Chuang, Hsiao-Chiang ; Huffman, Landis M. ; Comer, Mary L. ; Simmons, Jeff P. ; Pollak, Ilya

Author_Institution

Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN

fYear

2008

fDate

12-15 Oct. 2008

Firstpage

2280

Lastpage

2283

Abstract

We investigate the automated segmentation of microstructures of a nickel-based superalloy using digital microscopy data. We study the combination of a region merging segmentation method called the stabilized inverse diffusion equation (SIDE), and a stochastic segmentation method, the expectation-maximization/maximization of the posterior marginals (EM/MPM) algorithm. We use the SIDE algorithm to segment the grain boundaries and we use the EM/MPM algorithm to classify two phases of the material within each grain. Experimental results demonstrate the effectiveness of our approach.

Keywords

crystal microstructure; diffusion; expectation-maximisation algorithm; grain boundaries; image segmentation; nickel alloys; superalloys; NiJkJk; SIDE algorithm; automated segmentation; digital microscopy data; expectation-maximization algorithm; grain boundaries segmentation; maximization of the posterior marginals algorithm; microstructures segmentation; nickel-based superalloy; region merging segmentation; stabilized inverse diffusion equation; stochastic segmentation; Aerospace materials; Computer simulation; Equations; Grain boundaries; Image segmentation; Materials testing; Merging; Microscopy; Microstructure; Stochastic processes; Image segmentation; stochastic image processing;

fLanguage

English

Publisher

ieee

Conference_Titel

Image Processing, 2008. ICIP 2008. 15th IEEE International Conference on

Conference_Location

San Diego, CA

ISSN

1522-4880

Print_ISBN

978-1-4244-1765-0

Electronic_ISBN

1522-4880

Type

conf

DOI

10.1109/ICIP.2008.4712246

Filename

4712246