DocumentCode :
1873636
Title :
Status of C3MJ+ and C4MJ production concentrator solar cells at Spectrolab
Author :
Ermer, J.H. ; Jones, R.K. ; Hebert, P. ; Pien, P. ; King, R.R. ; Bhusari, D. ; Brandt, R. ; Taher, O.T.A. ; Fetzer, C.M. ; Kinsey, G.S. ; Karam, N.
Author_Institution :
Spectrolab, Inc., Boeing Co., Los Angeles, CA, USA
fYear :
2011
fDate :
19-24 June 2011
Abstract :
Multijunction solar cells based on III-V semiconductors remain the most efficient solar cells in the world and are the preferred technology in point-focus and dense-array CPV system architectures. 2011 will prove a pivotal year for CPV technology, with multiple system suppliers installing power plants in the MW to 10´s of MW scale. Spectrolab is working closely with CPV system manufacturers to provide a reliable and well-characterized cell technology in volumes commensurate with this demand. The C3MJ+ and C4MJ cell technologies are the latest in an evolutionary sequence of CPV solar cell designs, with conversion efficiencies approaching, or greater than 40%. Both device technologies are completing detailed characterization and qualification programs and both technologies have entered high volume production at Spectrolab in Sylmar, CA. Spectrolab is pursuing an aggressive development roadmap to further improve performance and reliability of next-generation cell designs. This paper reviews in detail the characterization of C3MJ+ and C4MJ production CPV cell properties, investigation of reliability in both laboratory and on-sun environments, and the technology roadmap for future improvements.
Keywords :
III-V semiconductors; reliability; solar cells; C3MJ+ cell technologies; C3MJ+ production concentrator solar cells; C4MJ cell technologies; C4MJ production concentrator solar cells; CPV solar cell designs; CPV system manufacturers; CPV technology; III-V semiconductors; Spectrolab; Sylmar; dense-array CPV system; multijunction solar cells; multiple system suppliers installing power plants; next-generation cell designs performance; next-generation cell designs reliability; Computer architecture; IEEE Xplore; Microprocessors; Photovoltaic cells; Production; Qualifications; Reliability;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2011 37th IEEE
Conference_Location :
Seattle, WA
ISSN :
0160-8371
Print_ISBN :
978-1-4244-9966-3
Type :
conf
DOI :
10.1109/PVSC.2011.6186656
Filename :
6186656
Link To Document :
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