DocumentCode
1873720
Title
Induced voltages and currents on gas pipelines with imperfect coatings due to faults in a nearby transmission line
Author
Christoforidis, Georgios C. ; Dokopoulos, Petros S. ; Psannis, Kostas E.
Author_Institution
Dept. of Electr. & Comput. Eng., Aristotle Univ. of Thessaloniki, Greece
Volume
4
fYear
2001
fDate
2001
Abstract
An improved hybrid method is discussed, employing a finite-element method along with Faraday´s law and standard circuit analysis, in order to predict the induced voltages and currents on a pipeline with defects on its coating, running parallel to a faulted line and remote earth. Such defects are a frequent situation especially when old pipelines are considered and are modeled as resistances, called leakage resistances. The fault is assumed to be outside the parallel exposure so that conductive interference is negligible and therefore the problem is a two-dimensional one. Input data are power line and pipeline configuration, physical characteristics of conductors and pipeline, fault and power system terminal parameters and location and value of leakage resistances. Simulation results show that for small values of leakage resistances, defects act as a mitigation method for the induced voltages on the pipeline. However, in that case large currents that flow to earth through the defects can damage the pipeline
Keywords
electric resistance; electromagnetic induction; electromagnetic interference; finite element analysis; power overhead lines; power transmission faults; Faraday´s law; finite-element method; gas pipelines; imperfect coatings; induced currents; induced voltages; inductive interference; leakage resistances; pipeline coating defects; power system terminal location; power system terminal parameters; standard circuit analysis; transmission line faults; Circuit analysis; Circuit faults; Coatings; Earth; Finite element methods; Interference; Pipelines; Power system modeling; Power system simulation; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Power Tech Proceedings, 2001 IEEE Porto
Conference_Location
Porto
Print_ISBN
0-7803-7139-9
Type
conf
DOI
10.1109/PTC.2001.964818
Filename
964818
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