Title :
Comparing fail-safe microcontroller architectures in light of IEC 61508
Author :
Mariani, Riccardo ; Fuhrmann, Peter
Author_Institution :
YOGITECH SpA, Pisa
Abstract :
In this paper, an overview is given on the main architectures used in the automotive to implement fail-safe microcontrollers. The concept of a new HW-centric, distributed and optimized architecture is also presented. In light of the IEC 61508 norm for safety related electronic systems, a comparisons between these different architectures is done based on a reference design. The paper concludes discussing how the presented architectures can be extended to become fail-functional
Keywords :
IEC standards; automotive electronics; microcontrollers; IEC 61508; automotive; electronic systems; fail-safe microcontroller architectures; optimized architecture; reference design; Application specific integrated circuits; Automotive engineering; Europe; Fault detection; Fault tolerant systems; IEC standards; Microcontrollers; Safety; Vehicle driving; Very large scale integration;
Conference_Titel :
Defect and Fault-Tolerance in VLSI Systems, 2007. DFT '07. 22nd IEEE International Symposium on
Conference_Location :
Rome
Print_ISBN :
978-0-7695-2885-4
DOI :
10.1109/DFT.2007.63
