DocumentCode
1873754
Title
Testing EHV secondary arcs
Author
Bán, G. ; Prikler, L. ; Bánfai, G.
Author_Institution
Dept. of Electr. Power Syst., Budapest Univ. of Technol. & Econ., Hungary
Volume
4
fYear
2001
fDate
2001
Abstract
The protection of the environment requires compact EHV tower constructions. This trend results in decreasing the clearances and phase-to-phase distances. It is expected, that both the number of faults and the amplitude of the secondary arc current will grow in the future. All these make it necessary to improve the efficiency of single-phase reclosing. Secondary arc duration values gained at field tests show a big spread and therefore they do not provide a reliable basis for selecting a suitable dead time. Analyzing the main processes affecting the secondary arc duration, the authors conclude that traveling wave phenomena arising in the intermittent period of secondary arcing have a determining effect on the arc duration. Considering the difficulties connected with field tests and the big influence of the weather conditions on the secondary arc duration, the authors propose to complete laboratory test circuits by such components, which affect the simulation of the wave processes. A method for the detection of the secondary arc extinction on 750 and 400 kV lines is mentioned, which offers a possibility to prevent inefficient reclosures
Keywords
arcs (electric); power overhead lines; power transmission faults; testing; 400 kV; 750 kV; EHV secondary arcs testing; clearances; compact EHV tower construction; environment protection; phase-to-phase distances; secondary arc current amplitude; secondary arc duration; secondary arc extinction; secondary arc initiation; shunt reactor; single-phase reclosing; transmission lines; traveling wave phenomena; weather conditions; wind velocity effect; Capacitance; Circuit faults; Circuit simulation; Circuit testing; Conductors; Laboratories; Poles and towers; Power transmission lines; Protection; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Power Tech Proceedings, 2001 IEEE Porto
Conference_Location
Porto
Print_ISBN
0-7803-7139-9
Type
conf
DOI
10.1109/PTC.2001.964819
Filename
964819
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