DocumentCode :
1873781
Title :
A Framework for Reliability Assessment and Enhancement in Multi-Processor Systems-On-Chip
Author :
Beltrame, G. ; Bolchini, C. ; Fossati, L. ; Miele, A. ; Sciuto, D.
Author_Institution :
Politecnico di Milano, Milano
fYear :
2007
fDate :
26-28 Sept. 2007
Firstpage :
132
Lastpage :
142
Abstract :
Reliability issues play a relevant role in the design of embedded systems for critical applications; this and the always increasing performance requirements lead to the adoption of new architectural solutions, as shown by the introduction of Multi-Processor Systems-on- Chip (MPSoC). MPSoCs raise new challenges related to the complexity of the interactions among several independent cores. This paper presents a framework, based on a simulation platform, for the design of this kind of embedded systems; the framework supports the use of reliability techniques in order to address fault detection and tolerance issues. The simulation platform is also adopted for a reliability assessment task, achieved by exploiting fault injection targeting each component of the system and by monitoring the effects on the entire architecture.
Keywords :
fault tolerance; system-on-chip; MPSoC; fault detection; fault tolerance; multiprocessor systems-on-chip; reliability assessment; Continuous production; Embedded system; Fault detection; Fault tolerant systems; Hardware; Monitoring; Production systems; System-on-a-chip; Time to market; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Defect and Fault-Tolerance in VLSI Systems, 2007. DFT '07. 22nd IEEE International Symposium on
Conference_Location :
Rome
ISSN :
1550-5774
Print_ISBN :
978-0-7695-2885-4
Type :
conf
DOI :
10.1109/DFT.2007.35
Filename :
4358381
Link To Document :
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