Title :
Using of pulse signals for DAC testing
Author :
Fexa, Pavel ; Vedral, Josef
Author_Institution :
Dept. of Meas., Czech Tech. Univ. in Prague, Prague, Czech Republic
Abstract :
The qualities of the method for testing dynamic parameters of DACs using pulse signal sinx/x are analyzed in this paper. Practical examples are compared with standard Single and Multi-Tone Digital Fourier Transform Test Methods. This method finds an application in the industry in less demanding economical short testing.
Keywords :
Fourier transforms; circuit testing; digital-analogue conversion; DAC testing; DAC testing dynamic parameters; economical short testing; multitone digital Fourier transform test method; pulse signal sinx-x; single-tone digital Fourier transform test method; Educational institutions; IEEE standards; Metrology; Performance evaluation; Testing; Total harmonic distortion; DAC testing; effective number of bit; impuls test signal; short testing; signal-to-noise and distortion;
Conference_Titel :
Applied Electronics (AE), 2011 International Conference on
Conference_Location :
Pilsen
Print_ISBN :
978-1-4577-0315-7
Electronic_ISBN :
1803-7232
